GPSC-GAN: A Data Enhanced Model for Intelligent Fault Diagnosis

Abstract

In manufacturing, accurate fault diagnosis is imperative but frequently impeded by the scarcity of data, which obstructs the development of effective data-driven diagnostic models. Although Generative Adversarial Networks (GANs) are an effective means of increasing data volume, they still face a challenge in concurrently generating high-quality and multi-mode samples for multiple fault categories. To solve this challenge, a novel data enhanced model GPSC (Gradient Penalty Separate Classifier)-GAN based on GAN is proposed in this paper, which is characterizing by fault scenario-agnostic. Firstly, a new separate classifier is developed to integrate into GAN to generate multimode fault samples. Secondly, Wasserstein distance with gradient penalty is introduced into the loss function of the discriminator to handle the optimization problem of the distribution similarity between generated samples and fault samples. Compared to the traditional GAN, the proposed model can more effectively produce generated samples that are aggregated with fault samples, which means the generated samples is high-quality. Meanwhile, experimental results on two different bearing datasets reveal that the generated data by the proposed model is applicable to assist the training of deep learning-based fault diagnosis models with high accuracy, and is also superior to the state-of-art models.

Publication DOI: https://doi.org/10.1109/tim.2024.3457925
Divisions: College of Engineering & Physical Sciences > School of Engineering and Technology > Mechanical, Biomedical & Design
College of Engineering & Physical Sciences > Smart and Sustainable Manufacturing
Funding Information: This work was supported in part funded by the Shanghai Science and technology program under Grant 22010500900; in part by the National Natural Science Foundation of China under Grant 52105534. (Corresponding author: Chao Liu.) Pin Lyu is with the School o
Additional Information: Copyright © 2024 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Uncontrolled Keywords: Class Imbalance,Data augmentation,Fault Diagnosis,Generative adversarial Network,Wasserstein Distance,Instrumentation,Electrical and Electronic Engineering
Publication ISSN: 0018-9456
Last Modified: 18 Oct 2024 16:35
Date Deposited: 18 Oct 2024 16:22
Full Text Link:
Related URLs: https://ieeexpl ... ument/10693567/ (Publisher URL)
http://www.scop ... tnerID=8YFLogxK (Scopus URL)
PURE Output Type: Article
Published Date: 2024-09-11
Published Online Date: 2024-09-11
Accepted Date: 2024-08-19
Authors: Lyu, Pin
Cheng, Yihong
Zhang, Ming (ORCID Profile 0000-0001-5202-5574)
Yu, Wenbing
Xia, Liqiao
Liu, Chao (ORCID Profile 0000-0001-7261-3832)

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