Scratching the surface: Elastic rotations beneath nanoscratch and nanoindentation tests

Abstract

In this paper, we investigate the residual deformation field in the vicinity of nanoscratch tests using two orientations of a Berkovich tip on an (001) Cu single crystal. We compare the deformation with that from indentation, in an attempt to understand the mechanisms of deformation in tangential sliding. The lattice rotation fields are mapped experimentally using high-resolution electron backscatter diffraction (HR-EBSD) on cross-sections prepared using focused ion beam (FIB). A physically-based crystal plasticity finite element model (CPFEM) is used to simulate the lattice rotation fields, and provide insight into the 3D rotation field surrounding a nano-scratch experiment, as it transitions from an initial static indentation to a steady-state scratch. The CPFEM simulations capture the experimental rotation fields with good fidelity, and show how the rotations about the scratch direction are reversed as the indenter moves away from the initial indentation.

Publication DOI: https://doi.org/10.1016/j.actamat.2020.08.051
Divisions: College of Engineering & Physical Sciences
Additional Information: Creative Commons Attribution 4.0 International (CC BY 4.0) Funding: En-gineering and Physical Sciences Research Council un-der Fellowship grants EP/R030537/1 and EP/N007239/1and Platform grant EP/P001645/1; UKRI Energy Programme (GrantNo. EP/T012250/1).
Uncontrolled Keywords: CPFEM,HR-EBSD,Nanoindentation,Nanoscratch,Electronic, Optical and Magnetic Materials,Ceramics and Composites,Polymers and Plastics,Metals and Alloys
Publication ISSN: 1873-2453
Last Modified: 26 Mar 2024 08:15
Date Deposited: 28 Aug 2020 08:22
Full Text Link:
Related URLs: https://www.sci ... 6583?via%3Dihub (Publisher URL)
http://www.scop ... tnerID=8YFLogxK (Scopus URL)
PURE Output Type: Article
Published Date: 2020-11
Published Online Date: 2020-08-25
Accepted Date: 2020-08-20
Authors: Kareer, A.
Tarleton, E.
Hardie, C.
Hainsworth, S.V. (ORCID Profile 0000-0001-9907-1236)
Wilkinson, A.J.

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