Study on fatigue and energy-dissipation properties of nanolayered Cu/Nb thin films

Abstract

Energy dissipation and fatigue properties of nano-layered thin films are less well studied than bulk properties. Existing experimental methods for studying energy dissipation properties, typically using magnetic interaction as a driving force at different frequencies and a laser-based deformation measurement system, are difficult to apply to two-dimensional materials. We propose a novel experimental method to perform dynamic testing on thin-film materials by driving a cantilever specimen at its fixed end with a bimorph piezoelectric actuator and monitoring the displacements of the specimen and the actuator with a fibre-optic system. Upon vibration, the specimen is greatly affected by its inertia, and behaves as a cantilever beam under base excitation in translation. At resonance, this method resembles the vibrating reed method conventionally used in the viscoelasticity community. The loss tangent is obtained from both the width of a resonance peak and a free-decay process. As for fatigue measurement, we implement a control algorithm into LabView to maintain maximum displacement of the specimen during the course of the experiment. The fatigue S-N curves are obtained.

Publication DOI: https://doi.org/10.2495/HPSM06031
Divisions: College of Engineering & Physical Sciences > School of Engineering and Technology > Mechanical, Biomedical & Design
College of Engineering & Physical Sciences
Additional Information: © 2006 WIT Press. This publication is freely available on the publisher's website.
Event Title: 3rd international conference on High Performance Structures and Materials
Event Type: Other
Event Dates: 2006-05-03 - 2006-05-05
Uncontrolled Keywords: nanolayered thin films,fatigue,loss tangent
ISBN: 978-1-84564-162-7, 978-1-84564-225-9
Full Text Link:
Related URLs: http://www.scop ... tnerID=8YFLogxK (Scopus URL)
http://www.witp ... onment/85/15918 (Publisher URL)
PURE Output Type: Conference contribution
Published Date: 2006
Authors: Wang, Y.-C.
Höchbauer, T.
Swadener, J.G. (ORCID Profile 0000-0001-5493-3461)
Darling, T.
Misra, A.
Hoagland, R.
Nastasi, M.

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