Parametric study of femtosecond inscription of microstructures for OCT artefact fabrication

Abstract

As optical coherence tomography (OCT) becomes widespread, validation and characterization of systems becomes important. Reference standards are required to qualitatively and quantitatively measure the performance between difference systems. This would allow the performance degradation of the system over time to be monitored. In this report, the properties of the femtosecond inscribed structures from three different systems for making suitable OCT characterization artefacts (phantoms) are analyzed. The parameter test samples are directly inscribed inside transparent materials. The structures are characterized using an optical microscope and a swept-source OCT. The high reproducibility of the inscribed structures shows high potential for producing multi-modality OCT calibration and characterization phantoms. Such that a single artefact can be used to characterize multiple performance parameters such the resolution, linearity, distortion, and imaging depths.

Publication DOI: https://doi.org/10.1117/12.907053
Divisions: College of Engineering & Physical Sciences > Aston Institute of Photonics Technology (AIPT)
Additional Information: Rasakanthan, Janarthanan; Lee, Graham Chun Bon; Woolliams, Peter D.; Sugden, Kate, "Parametric study of femtosecond inscription of microstructures for OCT artefact fabrication", Optical coherence tomography and coherence domain optical methods in biomedicine XVI, ed. Joseph A. Izatt; James G. Fujimoto; Valery V. Tuchin. Vol. 8213, 2012. Copyright (2012) Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. http://dx.doi.org/10.1117/12.907053
Event Title: Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XVI
Event Type: Other
Event Dates: 2012-01-23 - 2012-01-25
Uncontrolled Keywords: Calibration,Characterization,Femtosecond inscription,Optical coherence tomography,Phantoms,Standardization,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials,Biomaterials,Radiology Nuclear Medicine and imaging
ISBN: 978-0-8194-8856-5
Last Modified: 04 Jan 2024 17:24
Date Deposited: 02 Oct 2014 11:00
Full Text Link: http://proceedi ... ticleid=1275483
Related URLs: http://www.scop ... tnerID=8YFLogxK (Scopus URL)
PURE Output Type: Conference contribution
Published Date: 2012
Authors: Rasakanthan, Janarthanan
Lee, Graham Chun Bon (ORCID Profile 0000-0002-9073-685X)
Woolliams, Peter D.
Sugden, Kate (ORCID Profile 0000-0001-6323-1082)

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