Skantzos, Nikos, van Mourik, Jort, Saad, David and Kabashima, Yoshiyuki (2003). Average and reliability error exponents in low-density parity-check codes. Journal of Physics A: Mathematical and General, 36 (43), pp. 11131-11141.
Abstract
We present a theoretical method for a direct evaluation of the average and reliability error exponents in low-density parity-check error-correcting codes using methods of statistical physics. Results for the binary symmetric channel are presented for codes of both finite and infinite connectivity.
Publication DOI: | https://doi.org/10.1088/0305-4470/36/43/032 |
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Divisions: | College of Engineering & Physical Sciences > Systems analytics research institute (SARI) Aston University (General) |
Additional Information: | ©2003 IOP Publishing Ltd. After the Embargo Period, the full text of the Accepted Manuscript may be made available on the non-commercial repository for anyone with an internet connection to read and download. After the Embargo Period a CC BY-NC-ND 3.0 licence applies to the Accepted Manuscript, in which case it may then only be posted under that CC BY-NC-ND licence provided that all the terms of the licence are adhered to, and any copyright notice and any cover sheet applied by IOP is not deleted or modified. |
Uncontrolled Keywords: | error exponents,low-density parity-check codes |
Publication ISSN: | 0305-4470 |
Last Modified: | 04 Nov 2024 08:04 |
Date Deposited: | 04 Aug 2009 12:27 |
Full Text Link: | |
Related URLs: |
http://www.scop ... tnerID=8YFLogxK
(Scopus URL) http://iopscien ... rect=.iopscienc (Publisher URL) |
PURE Output Type: | Article |
Published Date: | 2003-10-15 |
Authors: |
Skantzos, Nikos
van Mourik, Jort ( 0000-0002-3172-2714) Saad, David ( 0000-0001-9821-2623) Kabashima, Yoshiyuki |