Extended-range fiber polarimetric strain sensor

Abstract

We describe a frequency-modulation technique that is applicable to two-beam interferometric systems illuminated by semiconductor diode lasers. The technique permits a determination of the optical path difference between the two arms of the interferometer and is used here to extend the range of a fiber polarimetric strain sensor by determining the order of the particular polarimetric fringe under consideration.

Publication DOI: https://doi.org/10.1364/OL.12.000744
Divisions: College of Engineering & Physical Sciences > School of Infrastructure and Sustainable Engineering > Engineering Systems and Supply Chain Management
College of Engineering & Physical Sciences > Aston Institute of Photonics Technology (AIPT)
Additional Information: © 1987 The Optical Society. This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/abstract.cfm?URI=ol-12-9-744. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
Uncontrolled Keywords: frequency-modulation technique,two-beam interferometric systems,semiconductor diode lasers,optical path difference,interferometer,fiber polarimetric strain sensor
Publication ISSN: 1539-4794
Last Modified: 29 Oct 2024 12:15
Date Deposited: 23 Mar 2011 14:28
Full Text Link:
Related URLs: http://www.opti ... URI=ol-12-9-744 (Publisher URL)
PURE Output Type: Article
Published Date: 1987
Authors: Taylor, R.M.
Webb, David J. (ORCID Profile 0000-0002-5495-1296)
Jones, Julian D.C.
Jackson, David A.

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