Multiobjective design optimization of IGBT power modules considering power cycling and thermal cycling

Ji, Bing, Song, Xueguan, Sciberras, Edward, Cao, Wenping, Hu, Yihua and Pickert, Volker (2015). Multiobjective design optimization of IGBT power modules considering power cycling and thermal cycling. IEEE Transactions on Power Electronics, 30 (5), pp. 2493-2504.

Abstract

Insulated-gate bipolar transistor (IGBT) power modules find widespread use in numerous power conversion applications where their reliability is of significant concern. Standard IGBT modules are fabricated for general-purpose applications while little has been designed for bespoke applications. However, conventional design of IGBTs can be improved by the multiobjective optimization technique. This paper proposes a novel design method to consider die-attachment solder failures induced by short power cycling and baseplate solder fatigue induced by the thermal cycling which are among major failure mechanisms of IGBTs. Thermal resistance is calculated analytically and the plastic work design is obtained with a high-fidelity finite-element model, which has been validated experimentally. The objective of minimizing the plastic work and constrain functions is formulated by the surrogate model. The nondominated sorting genetic algorithm-II is used to search for the Pareto-optimal solutions and the best design. The result of this combination generates an effective approach to optimize the physical structure of power electronic modules, taking account of historical environmental and operational conditions in the field.

Publication DOI: https://doi.org/10.1109/TPEL.2014.2365531
Divisions: Engineering & Applied Sciences
Additional Information: © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Uncontrolled Keywords: aging,fatigue,finite-element methods,insulated-gate bipolar transistors,multiobjective,optimization methods,power cycling,reliability,thermal cycling
Full Text Link: http://ieeexplo ... rnumber=6937146
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Published Date: 2015-05
Authors: Ji, Bing
Song, Xueguan
Sciberras, Edward
Cao, Wenping ( 0000-0002-8133-3020)
Hu, Yihua
Pickert, Volker

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Version: Accepted Version


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