800 nm WDM interrogation system for strain, temperature, and refractive index sensing based on tilted fiber Bragg grating

Suo, Rui, Chen, Xianfeng F., Zhou, Kaiming, Zhang, Lin and Bennion, Ian (2008). 800 nm WDM interrogation system for strain, temperature, and refractive index sensing based on tilted fiber Bragg grating. IEEE Sensors Journal, 8 (7), pp. 1273-1279.

Abstract

A low-cost high-resolution wavelength-division-multiplexing (WDM) interrogation system operating around 800 nm region with operational bandwidth up to 60 nm and resolution of 12.7 pm utilizing a tilted fiber Bragg grating (TFBG) and a CCDarray detector has been implemented. The system has been evaluated for interrogating fiber Bragg grating based strain, temperature sensors, giving sensitivities of 0.59 pm/µe and 5.6 pm/°C, which are in good agreement with previously reported values. Furthermore, the system has been utilized to detect the refractive index change of sample liquids, demonstrating a capability of measuring index change as small as 10¯5. In addition, the vectorial expression of phase match condition and fabrication of TFBG have been discussed.

Publication DOI: https://doi.org/10.1109/JSEN.2008.926527
Divisions: Engineering & Applied Sciences > Electrical, Electronic & Power Engineering
Engineering & Applied Sciences > Aston Institute of Photonics Technology
Additional Information: ©2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Uncontrolled Keywords: optical sensing,strain and temperature sensor,tilted fiber Bragg grating,wavelength-division-multiplexing interrogation system,Bragg gratings,CCD image sensors,fibre optic sensors,refractive index measurement,strain sensors,temperature sensors,wavelength division multiplexing,CCD-array detector,FBG fabrication,WDM interrogation system,phase match condition,refractive index sensing,strain sensing,temperature sensing,vectorial expression,wavelength 800 nm,wavelength-division-multiplexing,Engineering(all),Electrical and Electronic Engineering
Full Text Link: http://ieeexplo ... rnumber=4567500
Related URLs: http://www.scop ... tnerID=8YFLogxK (Scopus URL)
Published Date: 2008-07
Authors: Suo, Rui
Chen, Xianfeng F.
Zhou, Kaiming ( 0000-0002-6011-1912)
Zhang, Lin ( 0000-0002-1691-5577)
Bennion, Ian

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