Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy

Morrell, Alexander P., Mosselmans, J. Frederick W., Geraki, Kalotina, Ignatyev, Konstantin, Castillo-Michel, Hiram, Monksfield, Peter, Warfield, Adrian T., Febbraio, Maria, Roberts, Helen M., Addison, Owen and Martin, Richard A. (2018). Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy. Journal of Synchrotron Radiation, 2018 ,

Abstract

Synchrotron radiation X-ray fluorescence microscopy is frequently used to investigate the spatial distribution of elements within a wide range of samples. Interrogation of heterogeneous samples that contain large concentration ranges has the potential to produce image artefacts due to the profile of the X-ray beam. The presence of these artefacts and the distribution of flux within the beam profile can significantly affect qualitative and quantitative analyses. Two distinct correction methods have been generated by referencing the beam profile itself or by employing an adaptive-thresholding procedure. Both methods significantly improve qualitative imaging by removing the artefacts without compromising the low-intensity features. The beam-profile correction method improves quantitative results but requires accurate two-dimensional characterization of the X-ray beam profile.

Publication DOI: https://doi.org/10.1107/S160057751801247X
Divisions: Engineering & Applied Sciences > Chemical Engineering & Applied Chemistry
Engineering & Applied Sciences > Electrical, Electronic & Power Engineering
Engineering & Applied Sciences > Aston Institute of Materials Research (AIMR)
Additional Information: © 2018 International Union of Crystallography. Morrell, A. P., Mosselmans, J. F. W., Geraki, K., Ignatyev, K., Castillo-Michel, H., Monksfield, P., ... Martin, R. A. (2018). Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy. Journal of Synchrotron Radiation, 2018, [25]. DOI: 10.1107/S160057751801247X
Uncontrolled Keywords: X-ray fluorescence microscopy,X-ray fluorescence spectroscopy artefacts,Radiation,Nuclear and High Energy Physics,Instrumentation
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Related URLs: http://www.scop ... tnerID=8YFLogxK (Scopus URL)
http://scripts. ... 60057751801247X (Publisher URL)
Published Date: 2018-10-01
Authors: Morrell, Alexander P.
Mosselmans, J. Frederick W.
Geraki, Kalotina
Ignatyev, Konstantin
Castillo-Michel, Hiram
Monksfield, Peter
Warfield, Adrian T.
Febbraio, Maria
Roberts, Helen M.
Addison, Owen
Martin, Richard A. ( 0000-0002-6013-2334)

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