Methane detection scheme based upon the changing optical constants of a zinc oxide/platinum matrix created by a redox reaction and their effect upon surface plasmons

Abstract

We detect changes in the optical properties of a metal oxide semiconductor (MOS), ZnO, in a multi-thin-film matrix with platinum in the presence of the hydrocarbon gas methane. A limit of detection of 2% by volume with concentrations from 0 to 10% and maximum resolution of 0.15% with concentrations ranging from 30% to 80% at room temperature are demonstrated along with a selective chemical response to methane over carbon dioxide and the other alkane gases. The device yields the equivalent maximum bulk refractive index spectral sensitivity of 1.8 × 105 nm/RIU. This is the first time that the optical properties of MOS have been monitored to detect the presence of a specific gas. This single observation is a significant result, as MOS have a potentially large number of target gases, thus offering a new paradigm for gas sensing using MOSs.

Publication DOI: https://doi.org/10.1016/j.snb.2017.08.058
Dataset DOI: https://doi.org/10.17036/researchdata.aston.ac.uk.00000276
Divisions: Engineering & Applied Sciences > Electrical, Electronic & Power Engineering
Engineering & Applied Sciences > Aston Institute of Photonics Technology
Additional Information: © 2017 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/). Funding: Grants EP/J010413 and EP/J010391 for Aston University and University of Plymouth from the UK Engineering and Physical Sciences Research Council.
Uncontrolled Keywords: localized surface plasmons,metal oxide semiconductors,optical sensing,gas sensing,fibre optics
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Related URLs: https://www.sci ... 925400517314806 (Publisher URL)
PURE Output Type: Article
Published Date: 2018-02-01
Published Online Date: 2017-08-23
Accepted Date: 2017-08-07
Authors: Allsop, Thomas ( 0000-0001-8905-9014)
Kundrat, Vojtěch
Kalli, Kyriacos
Lee, Graham B.
Neal, Ron
Bond, Peter
Shi, Baogul
Sullivan, John
Culverhouse, Phil
Webb, David J. ( 0000-0002-5495-1296)

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