Central-tapped node linked modular fault-tolerance topology for SRM applications

Hu, Yihua, Gan, Chun, Cao, Wenping, Li, Wuhua and Finney, Stephen J. (2016). Central-tapped node linked modular fault-tolerance topology for SRM applications. IEEE Transactions on Power Electronics, 31 (2), pp. 1541-1554.

Abstract

Electric vehicles (EVs) and hybrid electric vehicles (HEVs) can reduce greenhouse gas emissions while switched reluctance motor (SRM) is one of the promising motor for such applications. This paper presents a novel SRM fault-diagnosis and fault-tolerance operation solution. Based on the traditional asymmetric half-bridge topology for the SRM driving, the central tapped winding of the SRM in modular half-bridge configuration are introduced to provide fault-diagnosis and fault-tolerance functions, which are set idle in normal conditions. The fault diagnosis can be achieved by detecting the characteristic of the excitation and demagnetization currents. An SRM fault-tolerance operation strategy is also realized by the proposed topology, which compensates for the missing phase torque under the open-circuit fault, and reduces the unbalanced phase current under the short-circuit fault due to the uncontrolled faulty phase. Furthermore, the current sensor placement strategy is also discussed to give two placement methods for low cost or modular structure. Simulation results in MATLAB/Simulink and experiments on a 750-W SRM validate the effectiveness of the proposed strategy, which may have significant implications and improve the reliability of EVs/HEVs.

Publication DOI: https://doi.org/10.1109/TPEL.2015.2414664
Divisions: Engineering & Applied Sciences
Additional Information: © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Full Text Link: http://ieeexplo ... rnumber=7063239
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Published Date: 2016-02
Authors: Hu, Yihua
Gan, Chun
Cao, Wenping ( 0000-0002-8133-3020)
Li, Wuhua
Finney, Stephen J.

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Version: Accepted Version


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