Novel spatial scanning technique for surface roughness measurement

Xie, F., Zhang, W., Jiang, X.Q., Zhang, L. and Bennion, I. (2003). Novel spatial scanning technique for surface roughness measurement. IN: The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. Annual meeting IEEE Lasers and Electro-Optics Society, 1 . IEEE.

Abstract

We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique.

Publication DOI: https://doi.org/10.1109/LEOS.2003.1251618
Divisions: Engineering & Applied Sciences > Electrical, electronic & power engineering
Engineering & Applied Sciences > Institute of Photonics
Event Title: 16th annual meeting of the IEEE Lasers and Electro-Optics Society, 2003
Event Type: Other
Event Dates: 2003-10-27 - 2003-10-28
Uncontrolled Keywords: diffraction gratings,fibre optic sensors,surface topography measurement,optical fibre dispersion,optical scanners,Industrial and Manufacturing Engineering,Control and Systems Engineering,Electrical and Electronic Engineering
Full Text Link: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1251618&tag=1
Related URLs: http://www.scopus.com/inward/record.url?scp=0344465386&partnerID=8YFLogxK (Scopus URL)
Published Date: 2003-10
Authors: Xie, F.
Zhang, W. ( 0000-0002-3584-8541)
Jiang, X.Q.
Zhang, L. ( 0000-0002-1691-5577)
Bennion, I.

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