Average and reliability error exponents in low-density parity-check codes

Skantzos, Nikos, van Mourik, Jort, Saad, David and Kabashima, Yoshiyuki (2003). Average and reliability error exponents in low-density parity-check codes. Journal of Physics A: Mathematical and General, 36 (43), pp. 11131-11141.

Abstract

We present a theoretical method for a direct evaluation of the average and reliability error exponents in low-density parity-check error-correcting codes using methods of statistical physics. Results for the binary symmetric channel are presented for codes of both finite and infinite connectivity.

Publication DOI: https://doi.org/10.1088/0305-4470/36/43/032
Divisions: Engineering & Applied Sciences > Mathematics
Engineering & Applied Sciences > Systems analytics research institute (SARI)
Additional Information: in press
Uncontrolled Keywords: error exponents,low-density parity-check codes
Full Text Link: http://iopscien ... rect=.iopscienc
Related URLs: http://www.scop ... tnerID=8YFLogxK (Scopus URL)
Published Date: 2003-10-15
Authors: Skantzos, Nikos
van Mourik, Jort
Saad, David ( 0000-0001-9821-2623)
Kabashima, Yoshiyuki

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